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The improvements made to ultra-thin windows for X-ray detectors in recent years have allowed for the detection of elements as light as lithium. However, their use with particle induced X-ray emission (PIXE) spectroscopy typically requires the addition of an absorber thick enough to prevent backscattered ions from reaching the detector. This also prevents lower energy (< 1 keV) X-rays from reaching the detector. By using a magnetic field to deflect backscattered ions away, the absorber can be eliminated, allowing for the detection of ultra-low energy X-rays. At the Ion Beam Laboratory of the University of North Texas, a prototype PIXE system using a magnetic deflector has been developed to allow for the detection and measurement of X-rays from light elements using a silicon drift X-ray detector with an ultra-thin window. With an average magnetic flux density of 0.88 T along the center, backscattered protons of an energy up to 1.22 MeV were successfully deflected away from the X-ray detector. Light element PIXE was performed with a 1 MeV proton beam on manganese oxide, sodium chloride and a Hibiscus rosa-sinensis leaf. Elements of 5 ≤ Z ≤ 30 were successfully detected. 

Particulate matter (PM) found in the air is one of the major sources of pollution and air‐borne diseases. Therefore, it is imperative to examine the elemental concentration distribution of the PM to identify the pollutant sources. In this study, it has demonstrated the capabilities of micro‐particle‐induced X‐ray emission (micro‐PIXE) spectroscopy in quantitative analysis of air samples collected from the Old Delhi outdoor market and indoor locations in the Panjab University hostel in the winter months. A 2‐million electronvolts energetic scanning proton micro‐beam (diameter ≈1 µm²) is used in micro‐PIXE experiments generating high‐resolution elemental maps of different regions of interest (ROI). Micro‐PIXE along with the GeoPIXE analysis provides a non‐destructive, standard‐less, and ng/mg level‐sensitive tool for the investigation of elemental distributions and highlighting pixels, which correlates to specific concentration ratios between elements at ROIs, thereby enabling a comprehensive understanding of the source of each elemental particulate. Si, Ca, and K detected in indoor PM suggest the source to soil erosion and crop burning, while high S levels in outdoor PM are primarily associated with coal power plants. Additionally, Sc, Ti, Cr, Mn, and Zn are found in outdoor samples, while indoor locations also contained trace amounts of V, Co, and Cu. 

Metal halide perovskite (MHP) solar cells are promising aerospace power sources given their potential as inexpensive, lightweight, and resilient solar electricity generators. Herein, the intrinsic radiation tolerance of unencapsulated methylammonium lead iodide/chloride (CH3NH3PbI3-xClx) films was isolated. Spatially resolved photoluminescence (PL) spectroscopy and confocal microscopy revealed the fundamental defect physics through optical changes as films were irradiated with 4.5 MeV neutrons and 20 keV protons at fluences between 5×1010 and 1×1016 p+/cm2. As proton radiation increased beyond 1×1013 p+/cm2, defects formed in the film, causing both a decrease in photoluminescence intensity and a 30% increase in surface darkening. All proton irradiated films additionally exhibited continuous increase of energy bandgaps and decreasing charge recombination lifetimes with increasing proton fluences. These optical changes in the absorber layer precede performance declines detectable in standard current-voltage measurements of complete solar cell devices and therefore have the potential of serving as early indicators of radiation tolerance. 

This paper discusses the in-situ characterization tools designed to assess radiation tolerance and elemental migration in perovskite materials. With the increasing use of perovskites in various technological applications, understanding their response to radiation exposure is paramount. Ion Beam Induced Charge (IBIC) emerges as a powerful tool for investigating the radiation tolerance of perovskites at the microscale. By employing focused ion beams, IBIC allows for the spatial mapping of charge carriers, offering insights into the material's electronic response to radiation-induced defects. This technique enables researchers to pinpoint areas of enhanced or suppressed charge collection, providing valuable information on the perovskite's intrinsic properties under irradiation. Rutherford Backscattering Spectrometry (RBS) complements the study by offering a quantitative analysis of elemental migration in perovskite materials. Through the precise measurement of backscattered ions, RBS provides a detailed understanding of the elemental composition and distribution within the perovskite lattice after radiation exposure. The integration of IBIC and RBS techniques in in-situ experiments enhances the comprehensive characterization of radiation effects on perovskites.